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Prof. Jean-Michel Nunzi visits SIOM
Update time: 12-14-2017
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On Dec. 12, 2017, Prof. Jean-Michel Nunzi, PIFI Fellow, from Queen’s University paid a visit to SIOM and delivered a presentation entitled “Nonlinear optics: from principles to hot topics - 3rd lecture - The complex nonlinear index of refraction”. Chaired by Prof. WANG Jun, this presentation was warmly welcomed by young researchers and graduate students.

In his former two lectures on Jun. 11 and Oct. 19, Prof. Jean-Michel Nunzi introduced optical nonlinearities on the basis of Maxwell equations, some organic materials for NLO constantly in use in his lab and their applications in light manipulation with light, susceptibilities.

The application of nonlinear optics to particular devices and laser beam manipulation effects requires a clear understanding of the susceptibilities and the development of performant diagnostic tool to identify the processes. His third talk, therefore, focused on the complex nonlinear index of refraction, origin of the susceptibilities, second harmonic generation and NLO PV. He first introduced unified figures of merit that allow comparison of various experiments in different contexts. And then he displayed a couple of useful diagnostic tools for the evaluation of materials properties, with application examples, such as CS2, Rhodamine, Polydiacetylene, etc.

Prof. Jean-Michel Nunzi is a full professor in Department of Physics, engineering Physics and Astronomy, Department of Chemistry, Queen’s University, Canada and currently a visiting scientist in SIOM under the CAS President’s International Fellowship Initiative for 2017. His research interests are the optical and electronic properties of organic materials and devices, including photo-physics, nonlinear optics, self-organization under light, charge generation and transport, solar cells, plastic lasers, nano-materials, bio-compatible materials and devices. He also studies the fabrication of chiral structures using light - matter interactions. Up to now, he has published 11 patents, 240 peer-reviewed publications. More than 7000 citations, H-index is 44. He is SPIE Senior Membership, IOP Fellow, ACS National Membership, Member of the Optical Society of America, and Member of Chemical Institute of Canada and Constituent Societies. He also serves as Editorial Board Member of Scientific Reports, Chinese Optics Letters and European Physical Journal: Applied Physics, and Energies.

@ Shanghai Institute of Optics and Fine Mechanics Tel:02169918000 Shanghai ICP NO.0501538